期刊文献+

便携式通讯终端中电触点磨损的研究

Investigation of Wear on Electrical Contacts in Portable Communication Terminals
下载PDF
导出
摘要 分析了便携式通讯终端中PCB镀金电触点的表面磨损情况。连接器簧片与PCB触点之间相对运动造成的磨损加剧了污染,是造成接触失效的主要原因之一。磨损过程为先粘结再擦伤,最后镀金层被磨穿。磨损碎屑被逐渐推到磨损区端部与尘土、摩擦聚合物混合聚集在一起。触点表面磨损的主要方向和磨损区尺寸取决于触点的配合结构。研究结果为建立便携式通讯终端中镀金电触点失效模拟奠定了基础。 The wear on the gold plated contacts was analyzed between the spring terminals of connectors and printed circuit board (PCB) in failed portable communication terminals, The wear caused by the relative-motion between the spring and PCB contacts made contamination more worse, and this was one of the main reasons to result in the contact failure. The process of wear was from adhesive to abrasive, the gold plating was worn out at last. The wear debris was pushed to the ends of wear tracks mixed with dust particles and frictional polymer. The direction and amplitude of wear were decided by the mating structures of contacts. The investigation results are the foundation of failure simulation of electrical contacts in portable communication terminals.
作者 周怡琳 张华
出处 《电子元件与材料》 CAS CSCD 北大核心 2006年第3期59-62,共4页 Electronic Components And Materials
基金 国家自然基金项目(50277002)
关键词 电子技术 磨损 污染 镀金触点 便携式通讯终端 electronic technology wear contamination gold plated contacts portable communication terminals
  • 相关文献

参考文献9

  • 1Antler M.Electrical effects of fretting connector contacts materials:a review[J].Wear,1985,106(1-3):5-33.
  • 2Antler M.Survey of contact fretting in electrical connectors[A].Thirtieth IEEE Holm Conference on Electrical Contacts[C].1984.3-22.
  • 3Zhang J G,Gao J C,Lin X Y.Analysis of connector contact failure[J].IEICE Trans Electron,2003,E86-C(6):945-952.
  • 4Xu L J.Dynamic influence on contact failure[J].IEICE Trans Electron,2003,E86-C(6):963-967.
  • 5Zhou Y L,He Z P,Zhang J G..The effect of environmental contamination on gold plated contacts in portable electronic devices[A].International Session on Electro-Mechanical Devices[C].2003.9-14.
  • 6Feng C F,Zhang J G,Luo G P,et al.Inspection of the contaminants at failed connector contacts[A].Proc.51st IEEE Holm Conference on Electric Contacts[C].2005.115-120.
  • 7周怡琳.电触点污染程度评估的初步研究[J].电工技术学报,2004,:9-22.
  • 8Antler M,Drozdowicz M H.Fretting corrosion of gold plated connector contacts[J].Wear,1981-1982,(74):27-30.
  • 9Braunovic M.Fretting of nickel-coated aluminum conductors[A].Proc Thirty-sixth IEEE Holm Conference on Electrical Contacts[C].1990.461-471.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部