摘要
On the basis of EST (Equivalent STate hashing) algorithm, this paper researches a kind of test generation algorithm based on search state dominance for combinational circuit. According to the dominance relation of the E-frontier (evaluation frontier), we can prove that this algorithm can terminate unnecessary searching step of test pattern earlier than the EST algorithm through some examples, so this algorithm can reduce the time of test generation. The test patterns calculated can detect faults given through simulation.
On the basis of EST （ Equivalent STate hashing） algorithm, this paper researches a kind of test generation algorithm based on search state dominance for combinational circuit. According to the dominance relation of the E-frontier （evaluation frontier）, we can prove that this algorithm can terminate unnecessary searching step of test pattern earlier than the EST algorithm through some examples, so this algorithm can reduce the time of test generation. The test patterns calculated can detect faults given through simulation.
