SOC测试访问机制

Test Access Mechanism for SOC

以复用为基础,通过测试访问机制(TAM,TestAccessMechanism)实现对深嵌在SOC(SystemOnChip)内部的IP核(In鄄tellectualProperty,知识产权模块)的测试,是解决SOC测试的根本方法。本文将介绍现有的几类典型的测试访问机制:(1)直接测试访问,(2)基于总线的测试访问机制,(3)基于透明模型的访问机制等。分析它们的特点,探讨面临的主要问题。

Based on reuse, Test Access Mechanism （TAM） is the radical foundation to test the deeply embedded IP （Intellectual Property） from the pins of SOC at the chip level. Main and representative kinds of TAM： （1）direct test access mechanism, （2） test access mechanism based on Bus, （3） test access mechanism according to the transparency of the IP core, etc., are analyzed and surveyed from the reuse point in following. Finally, we discuss issues remain to be resolved.