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改造国产ICP进行低温刻蚀

Low Temperature Etching in Improved P-2BICP
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摘要 低温刻蚀被用来进行硅微深孔加工。文中介绍了感应耦合等离子体(ICP)刻蚀原理,通过对国产ICP进行改造,在SF6/O2气体条件下进行低温刻蚀,利用低温钝化机理控制工艺,减少器件损伤。 A cryogenic SF6/O2 plasma process has been used to investigate the etching of deep holes in silicon wafers. The etching principle of inductive couple plasmas was introduced in this paper. Passivation mechanisms of Si trenches involved in SF6/O2 cryogenic plasma etching were introduced simply in order to better control the process and avoid defects.
出处 《河南机电高等专科学校学报》 CAS 2005年第6期1-2,共2页 Journal of Henan Mechanical and Electrical Engineering College
关键词 感应耦合等离子体(ICP) 低温 钝化 机理 Inductively Coupled Plasma (ICP) Cryogenic Passivation Mechanism
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  • 1F A Khan, L Zhou, V Kumar, et al. High rate etching of AIN using BCl3/Cl2/Ar inductively coupled plasma[J]. Materials Science and Engineering,2002,B 95:51 - 54.
  • 2J Etrillard, J F Bresse, C Daguet,et al. Low damage dry etching of Ⅲ - V materials for heterojunction bipolar transistor applications using a chlorinated inductively coupled plasma[J]. J Vac Sci Technol, 1999,A 17(4) : 1174 - 1181.
  • 3B Ronga, E van der Drift, R J Reeves, et al. Inductively coupled plamaa etching of CaN and its effect on electrical characteristics[J]. J Vac Sci Technol, 2001,B19(6) : 2917- 2920.
  • 4Y J Lee, S W Hwang, G Y Yeom,et al. Etch- induced damage in single crystal Si trench etching by planar inductively coupled Cl2/N2 and Cl2/HBr plasmas[J ]. Thin Solid Films, 1999, (341) :168- 171.
  • 5S Bretoiu, D Di Mola, E Fioravanti, et al. Inductively coupled plasma etching for arrayed waveguide gratings fabrication in silica on silicon technology[J]. J Vac Sci Technol,2002, B 20(5) :2085 - 2090.
  • 6F A Khan, L Zhou, A T Ping,et al. Inductively coupled plasma reactive ion etching of AlxCa1 - xN for application in laser facet formation[J]. J Vac Sci Technol, 1999,B 17(6): 2750-2754.
  • 7Kurobe T, Mukaihara T, Yamanaka N, et al. CH4/H2 inductively coupled plasma (ICP) etching for high performance CaInAsP buried heterostructure lasers[A]. International Conference on Indium Phosphide and Related Materials[C]. IEEE,2000. 506 - 509.
  • 8D S Wuua, C R Chung,Y H Liu, et al. Deep etch of GaP using high- density plasma for light- emitting diode applications[J]. J Vac Sci Technol, 2002,B 20(3) :902 -908.
  • 9T E F M Standaert, M Schaepkens, N R Rueger, et al. High density fluorocarbon etching of silicon in an inductively coupled plasma: Mechanism of etching through a thick steady state fluorocarbon layer[J ]. J Vac Sci Technol, 1998, A16(1): 239 - 249.
  • 10Saurabh J Ullal, Harmeet Singh, John Daugherty, et al. Maintaining reproducible plasma reactor wall conditions: SF6 plasma cleaning of films deposited on chamber walks during Cl2/O2 plasma etching of Si[J]. J Vac Sci Technol, 2002, A 20(4) : 1196 - 1201.

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