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并行电子能量损失谱仪中多重四极透镜系统物方视场的模拟

Simulation about the field of view in multiple lenses system used in parallel electron energy loss spectroscopy
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摘要 通过对三重四极透镜成像系统的渐晕模拟,研究了并行电子能量损失谱仪中物方视场、漂移管径以及与电荷耦合探测器(CCD)幅面尺寸的对应关系,并由它们间的相互关系确定了与CCD幅面二维探测器尺寸相匹配的漂移管径。 Field of view of a multiple quadropole lenses system was simulated for use in parallel electron energy loss spectroscopy. Based on vignetting factor analysis, it is shown that the field of view are different in the energy non-dispersion plane and in energy dispersion plane, because of the different combination of aperture stop and vignetting stop. The field of view is inversely proportional to the ratio value of aperture angle in energy dispersion plane because of less effect of entrance window(the first quadropole lens as vignetting stop), but no such simple relation was found in the energy non-disperse plane because the field of view is determined by entrance window( the third quadropole lens as vignetting stop) in the plane. Our analysis can be used to determine the diameter of drift tube which can be matched with the frame width of the chosen CCD detector.
作者 王志伟 袁俊
出处 《电子显微学报》 CAS CSCD 2006年第1期4-8,共5页 Journal of Chinese Electron Microscopy Society
基金 国家973重点基础研究发展计划子项目(No.2002B613501)
关键词 并行电子能量损失谱仪 三重四极透镜 高斯光学 物方视场 渐晕 parallel electron energy loss spectrometer quadrupele lens system gaussian optics field of view vignetting
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参考文献9

  • 1Joy D C,et al.A practical electron spectrometer for chemical analysis[ J].Journal of Microscopy,1978,114:117-129.
  • 2Strauss M G,et al.CCD-based parallel detection system for electron energy-loss spectroscopy and imaging [ J ].Ultramicroscopy,1987,22:117-124.
  • 3Crewe A V,Isaaacson M,Johnson D.A high resolution electron spectrometer for use in transmission scanning electron microscopy [ J ].Review of Scientific Instruments,1971,42:411-420.
  • 4Krivanek O L,Ahn C C,Keeney R B.Parallel detection electron spectrometer using quadrupole lenses [ J ].Ultramicroscopy,1987,22:103-116.
  • 5Egerton R F.Electron energy-loss spectroscopy in the transmission electron microscope [ M ].New York:Plenum,1986.32-49.
  • 6进腾大辅,等.材料评价的分析电子显微方法[M].北京:冶金工业出版社,2001.50-58.
  • 7Born M,et al.Principles of optics [ M ].Cambridge:Cambridge University Press,1999.199-201.
  • 8McMullan D.Beam stabilizer for an electron spectrometer[C].In:Electron Microscopy and Analysis 1993 Institute of Physics Conference Series.University of Live,1993.511-514.
  • 9Bleloch A,et al.Canceling energy drift in a PEELS spectrometer.In:Electron Microscopy and Analysis 1999Institute of Physics Conference Series [ C ].University of Sheffield,1999.195-198.

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