嵌入式系统的存储器测试

Testing For Embedded Memory

文章认为,电子设备中嵌入式系统的存储器有可能在3个方面出现问题,应该从数据总线、地址总线和存储器件等方面进行测试以发现问题.

This paper thinks that the memory of embedded system in electronic equipment may cause some problems in three aspects. So we should test it to find where the problems exist from those ways such as data bus, address bus and memory device.