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基于切割法的时序电路等价验证 被引量:1

Sequential Equivalence Check Using Cuts
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摘要 在Van Eijk时序电路等价验证算法中引入切割法,提出一种改进算法.由切割法引发的错反问题同时得到解决,合理的切割可以使时序电路等价验证只需较少时间.改进算法用SAT解答器作为计算引擎.实验结果表明,改进算法的运行速度约为原先算法的2倍. An improved algorithm which combines cut points technique with Van Eijk's sequential equivalence checking algorithm is presented. The false negative problem caused by the cut technique is solved, and reasonable cut results in less time for sequential equivalence checking. The calculating engine of the proposed algorithm is SAT-Solver. Experimental resuits show that the proposed algorithm can double the original speed.
作者 黄伟 唐璞山
出处 《复旦学报(自然科学版)》 CAS CSCD 北大核心 2006年第1期102-106,共5页 Journal of Fudan University:Natural Science
基金 国家自然科学基金资助项目(90207002) 国家"八六三"计划资助项目(2002AA1Z1460)
关键词 半导体技术 计算机辅助设计 形式验证 SAT解答器 semiconductor technology computer-aided design formal verification SAT-solver
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参考文献4

  • 1Burch J,Clark E,McMillan K,et al.Symbolic model check for sequential circuit verification[ J ].IEEE.Trans On Computer-Aided Design,1994,13(4):401-424.
  • 2Van Eijk C A J.Sequential equivalence checking based on structural similarities[J ].IEEE Trans on ComputerAided Design of Integrated Circuits and Systems,2000,19(7):814-819.
  • 3Huang S Y,Cheng K T,Chen K C.AQUILA:an equivalence verifier for large sequential circuits[ EB/OL].http://ieeexplore.ieee.org/iel3/4762/13192/00600302.pdf,2000-08-04/2004-12-15.
  • 4Kuehlmann A,Krohm F.Equivalence checking using cuts and heaps[EB/OL].http://ieeexplore.ieee.org/iel3/4655/13048/00597155.pdf,2004-02-26/2004-12-15.

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