摘要
本文在4.2K下测定了液相外延HgCdTe MIS结构样品的电容谱,磁阻振荡以及迴旋共振效应,并从实验测量结果,采用物理参数拟合法,确定了该样品在电量子限条件下反型层电子子能带结构,包括基态子能带能量E_o、费密能级E_F,子能带电子有效质量m~*(E_F)、m~*(E_o)、反型层平均厚度Z_i、耗尽层厚度Z_d,以及它们随子能带电子浓度N_s的变化。
The measurements of capacitance spectroscopy, magnetotransport oscillation and cyclotronresonance for LPE HgCdTe MIS structure samples are performed at temperature of 4.2 K, andthe inversion layer electron concentration N_3 dependent subband structures including subbandenergy E_0, Fermi energy E_f, effective mass M~*, average depth of inversion layer Z_0 anddepletion layer depth Z_d in the electric quantum limit are determined quantitatively from theexperimental measurements by using the physical parameter fitting method (PPFM).
基金
国家自然科学基金
