JIC单点计算法与试样厚度的关系

A Study of the relationship between the J IC single point method and specimen thickness

运用断裂力学方法讨论了ＪＩＣ单点计算法与试样厚度的关系．结果表明，在平面应变条件下，试样厚度的改变不影响ＪＩＣ单点计算公式的使用；本文工作为使用Ｂ＝Ｗ／１．２。

With the application of fracture mechanics, the relationship between the J IC single point method and the thickness of a three point bending specimen is studied. The results show that, under the plain strain condition, the changes of a specimen thickness do not affect the J IC single point formula and this theoretically supports the use of specimen pattern B=W/1.2、S=4W in the developed J IC analytical method by single specimen.