低温低噪声放大器噪声测试系统

A Noise Test-system for Cryogenic Low Noise Amplifiers

在低噪声放大器噪声线性的基础上,介绍了负载温度可变法,用于测量低温低噪声放大器的噪声。建立一套低温放大器噪声测试系统,并分析了系统的测量误差。利用系统测量了S波段和C波段低温放大器各1个,测试结果与国外同类测试系统的测试结果相符。系统的建立为我国自主研发低温低噪声放大器提供了必要条件。

On the basis of the noise linearity of low noise amplifier （LNA）, the variable load temperature method is introduced to measure noise properties of cryogenic LNAs. Based on this method, a cryogenic LNA noise-test- system has been developed, and its test uncertainty has been analyzed. With the system, an S-band and a C-band cryogenic LNAs have been tested respectively, and the results match the results given by other similar test- systems overseas. The test-system makes it possible to develop domestic cryogenic LNAs.