用ATR方法研究液晶表面光学性质

The study of optical property of liquid crystal surface using ATR method

本文用衰减全反射方法（ＡＴＲ）研究液晶在基片表面上的性质，测试在外电场作用下液晶分子重新定向引起光学性质的变化。液晶薄层的光学常数和厚度用ＡＴＲ曲线拟合计算。

The attenuated total renection (ATR )method is employed to study surface property of liquid crystal (LC) and to measure the optical property of LC in applied electric field. The optical constants and thicknesses ofthin liquid crystal on metal can be measured by ATR method.