摘要
简述了纱线的材料系数对纱疵分级仪检测性能的影响;提出了采用单片微机控制的材料系数自动修正系统,并介绍了实施方案。
This arcticle briefly introduces the influence of the yam material coefficient on testing performance of the yarn defect classifier, put forward the idea to automatically correct yarn material co-efficient by using single chip microprocessor with its pratice also given.
出处
《上海纺织科技》
北大核心
2006年第3期47-48,共2页
Shanghai Textile Science & Technology