摘要
本文根据固体、液体、气体及介质薄膜物理性质上的差异,分别给出了它们折射率的测量原理、方法及测量精度,并分析了误差产生的原因。
The refraction index measure principle, method and precision of solid, liquid,gas state and thin film material was given respectively in this paper according to theirdiffferent physics property,and also the factors accounting for measure error was analysed.
出处
《光学仪器》
1996年第3期8-12,共5页
Optical Instruments
关键词
折射率
测量
精度
材料试验
Refraction Index,Measure Precison,Error Analyses,Prism,Michelson Interferemeter