摘要
为了有效地降低新产品研发的风险,提高产品可靠性,必须进行失效模式分析,但大型复杂产品的系统复杂性,给全面分析失效模式的影响和原因带来困难。文章从产品的用户需求出发,对产品的功能进行分析,并从产品结构中找出失效的原因,建立了失效机制模型。通过对微电子装备的研发进行分析,该模型能明显地克服产品研发中的风险。
The failure modes and effects analysis should be done in order to reduce the developing risk and improve the reliability of products. Complexity of the large - scale complex products causes this comprehensive analysis difficult. Failure modes will be found by analyzing functions of the product, factors that cause the failure will be explored by auditing its' structures and then the failure mechanism will be modeled. With this model, the FMEA of a micro - electronic equipment is analyzed and it shows the developing risk is reduced remarkably.
出处
《机电一体化》
2006年第2期40-43,共4页
Mechatronics
关键词
失效模式
失效模式影响分析
产品研发
failure mode failure modes and effects analysis product developing