摘要
A systematic, accurate and robust evaluating method for fine pitch printed circuit board （PCB） positioning assessment in testing fixture is developed. Targeting reliability of bed-of-nails tester is successfully evaluated by the 2D pattern transform. Probe offset vector with its Weibull and Gaussian distribution estimates are obtained for further investigation about the causes of misalignment on the basis of a batch tests for same kind of PCBs.
A systematic, accurate and robust evaluating method for fine pitch printed circuit board （PCB） positioning assessment in testing fixture is developed. Targeting reliability of bed-of-nails tester is successfully evaluated by the 2D pattern transform. Probe offset vector with its Weibull and Gaussian distribution estimates are obtained for further investigation about the causes of misalignment on the basis of a batch tests for same kind of PCBs.
基金
This project is supported by US Pennsylvania Dept. of Community & Economic Development(No.20-906-0015)National Natural Science Foundation of China(No.50390064, No.50575230)National Basic Research Program of China(973 Program, No.2003CB716202).
