原子过程对极向CXRS测量影响的数值模拟

Simulation of effect of atomic process on poloidal CXRS measurement

考虑到原子过程的影响,对极向CXRS测量过程进行了数值模拟.计算结果表明由于受辐射率、回旋运动以及离子辐射寿命的影响,测量的结果会在离子逆磁漂移方向高估了离子的旋转速度,而低估了离子的温度.这种偏差会随着离子温度的升高、磁场的增加而增大.相对与原子过程的影响来说,由于等离子体非均匀性所引起的速度和温度的偏离很小,可以忽略不计.

With consideration of the effects of atomic process, a simple code modeling the correction to poloidal charge-exchange recombination spectroscopy （CXRS） measurement is developed. The simulation results show that the measured poloidal velocity shift is overestimated in the ion diamagnetic drift direction and the apparent ion temperature is underestimated because of the effects of energy-dependent emission rate and finite lifetime of excited ions. This deviation will be more obvious with the increase of temperature or magnetic field. The contributions from gradients of density and temperature are negligible compared to that from the atomic process.