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基于HP3048A系统的晶体振荡器相位噪声的快速测量方法

Approach of Oscillator Phase Noise Measurement Based on HP3048A Phase Noise Measurement System
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摘要 介绍了一种基于HP3048A相位噪声测量系统的相位噪声的拓展测量方法(即用USB接口卡取代HPIB接口卡,用与待测信号源具有相同中心频率的VCO取代HP8662),讨论了该拓展方法在射频信号源相位噪声测量中的应用,并给出了测量系统噪声本底的方法以及射频晶振的典型测量结果。 An expanded approach of the phase noise measurement based on the HP3048A phase noise measurement system is described. That is replacing the HP-IB card with USB interface card,and using VCO which has the same center frequency with the source to be tested to replace HP8662. The application of this expanded system in the RF source phase noise measurement and the typical measurement results are presented.
出处 《现代电子技术》 2006年第7期105-106,共2页 Modern Electronics Technique
关键词 相位噪声测量 压控晶体振荡器 锁相环技术 射频 phase noise measurement voltage controlled crystal oscillater phose lock loop technology radio freqaency
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参考文献3

  • 1Parker T E. Characteristic and Source of Phase Noise in Stable Oscillators. Proceedings of the 41st Annual Symposium on Frequency Control, 1987.
  • 2HP3048A Option 301 Phase Noise Measurement System Operation Manual 03048 - 90042.
  • 3戴维君.用频谱仪测量相位噪声的方法[J].国外电子测量技术,2001,20(3):11-12. 被引量:10

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