摘要
采用电感耦合等离子体-原子发射光谱法同时测定彩涂前处理表面调整转化层中Ti、Ni含量及钝化膜中Cr含量。以表征表面调整转化层厚度及钝化膜厚度,采用本方法准确度高、快速简便,经试验结果令人满意。
The contents of Ti,Ni in conversion layer before colour-coating and Cr in passivc film were simt, ltaneously measured by ICP-AES to determine the thickness of conversion and passive layer. The method is precise,simple and fast.
出处
《光谱实验室》
CAS
CSCD
2006年第2期261-263,共3页
Chinese Journal of Spectroscopy Laboratory