全片层γ-TiAl基合金屈服应力的微结构尺度效应

Size Effects of Microstructure on Yield Stress of Fully Lamellar γ-TiAl Based Alloys

本文基于多位错塞积模型,研究了-γTiAl基全片层组织合金的屈服应力与微观结构多尺度的关系,给出了全片层-γTiAl基合金屈服应力的解析计算公式。重点分析了合金中PST颗粒片层界面强度τλc、晶界强度τdc、片层厚度λ及PST颗粒大小尺度d对合金屈服应力大小的影响。

In this paper, based on the multiple-piled-up dislocation model , numerical and analytical methods were advanced to establish the relation between the yield stress of fully lamellar γ-TiAl based alloys and the multi-scale effect of the material, such as interface strength , grain boundary strength, lamellar thickness, grain size. An analytical formula quantitatively for yield stress of fully lameUar γ-TiAl based alloys was established. The influence of interface strength τλc, grain boundary strength τdc, lumeUar thickness γ, grain size d on the yield stress was particularly analyzed.