Nd∶GGG晶体荧光寿命的测试及受激发射截面的计算

The calculation of stimulated-emission cross-section and the testing of fluorescence lifetime of Nd∶GGG crystal

介绍了荧光寿命的测试原理。设计了荧光寿命测试系统。利用脉冲取样技术测试了Nd∶GGG晶体的荧光寿命,约为250μs。采用英国的荧光光谱仪,在室温条件下,用波长为488nm的Ar离子激光器激发Nd:GGG晶体,获得了Nd:GGG晶体的荧光光谱,计算出的Nd∶GGG晶体的受激发射截面σ(λ)为21.57×10-20cm2。

The fluorescence lifetime testing principle is introduced, and testing system is designed. The Nd：GGG crystal fluorescence lifetime was measured to be 250μs by pulse sampling techniques. Fluorescence spectrum of Nd ： GGG crystal was obtained under excitation with the 488 nm argon ion laser at room temperature with British fluorescence spectrometer, and the stimulated-emission cross-section is calculated to be 21.57 × 10^-20cm^2.