摘要
用一台理想设备在最少的测试次数中,从n个硬币中挑选出m个不同的伪硬币。在该文中,我们通过分析鉴别m个不同的伪硬币中的理想设备基本模型的结果,得到了在最坏的情况下的一个确定的测试过程,我们证明这个测试过程是一个最优分组测试过程。对于n个硬币中的m个相同伪硬币,给出了鉴别n个硬币中m个相同伪硬币的两个最优分组测试过程。
This paper is concerned with the problem of with n - m standard coins, in the minimum detecting m different defective coins, mixed number with the group testing on an ideal device. In the paper the authors survey results from basic model of the ideal device in identifying the m different defective coins with an exact testing procedure in the worst case obtained. It is proved that the testing procedure is optimal. For m uniform defective coins, mixed with n - m standard coins, the two optimal group testing procedures in identifying the m different defective coins among n coins are obtained.
出处
《工程数学学报》
CSCD
北大核心
2006年第2期361-364,共4页
Chinese Journal of Engineering Mathematics
基金
Shannxi Province Natural Science Foundation(2001SL03).
关键词
伪硬币
标准硬币
信息论下界
分组测试
defective coin
standard coin
information-theoretic lower bound
group testing
