摘要
采用射频磁控溅射法在玻璃基片上制备了Nd(Tb,Dy)Co/Cr薄膜.X射线衍射仪分析结果表明溅射制得的Nd(Tb,Dy)Co薄膜为非晶结构.振动样品磁强计(VSM)测试结果显示NdTbCo薄膜垂直膜面方向矫顽力与剩磁矩形比分别达到308.8kA/m和0.732,而平行膜面方向矫顽力与剩磁矩形比分别仅为22.3kA/m和0.173,这表明NdTbCo薄膜具有垂直磁各向异性.随着Nd掺杂量的增加,Nd(Tb,Dy)Co薄膜的矫顽力逐渐降低,克尔旋转角与反射率则逐渐升高.(NdxTb1-x)31Co69的克尔旋转角和反射率分别从x=0的0.2720°,0.2616,上升到x=0.338的0.3258°,0.3320.(NdxDy1-x)33Co67的克尔旋转角和反射率分别从x=0.210的0.2761°,0.3054,上升到了x=0.321的0.3231°,0.3974.Nd掺杂量对克尔旋转角的影响可用Nd(Tb,Dy)Co的亚铁磁结构进行解释.
Thin films of Nd（Tb,Dy）Co/Cr were prepared onto glass substrate by RF magnetron sputtering and amorphous shown by X-ray diffraction （XRD）. The results from vibrating sample magnetometer（VSM） measurement revealed that NdTbCo thin films had perpendicular magnetic anisotropy. The perpendicular coercivity and remanence square ratio reached 308.8 kA/m and 0. 732 respectively, and the inplanar coercivity and remanence square ratio were only 22.3 kA/m and 0. 173 respectively. With the addition of Nd, the coercivity decreased gradually, while kerr rotation angle and reflectivily increased step by step. When x increased from 0 to 0. 338, kerr rotation angle and reflectivity of （NdxTb1-x）31Co69 thin films increased from 0. 272 0°, 0. 261 6 to 0. 325 8°, 0. 332 0 respectively. When x increased from 0. 210 to 0. 321, kerr rotation angle and reflectivity of （NdxDy1-x）33 Co67 thin films increased from 0. 276 1°, 0. 305 4 to 0. 323 1°,0. 397 4 respectively. The effect of Nd addition on kerr rotation angle was explained by the ferrimagnetic structure of Nd（Tb,Dy）Co.
出处
《华中科技大学学报（自然科学版）》
EI
CAS
CSCD
北大核心
2006年第4期5-7,共3页
Journal of Huazhong University of Science and Technology(Natural Science Edition)
基金
国家自然科学基金重大项目(60490290).
关键词
射频磁控溅射
垂直磁各向异性
矫顽力
克尔旋转角
radio frequency magnetron sputtering
perpendicular magnetic anisotropy
coercivity
kerrrotation angle
