摘要
采用电导电流方法分别测试了杜邦公司纳米杂化聚酰亚胺薄膜(100CR)和原始聚酰亚胺薄膜(100HN)未老化、10 MV/m、20 MV/m电晕强度8 h老化后的电导电流,发现杂化膜的电流量比原始膜大近一个数量级,杂化膜未老化时的阈值为40 MV/m,而原始膜为35 MV/m,且两者的电老化阈值均随电老化强度的增加而减小。这些数据及曲线的获得对理解聚合物电老化机理和绝缘材料的合成改性提供重要参考价值。
The electric conduction current characteristics of both Dupont original and coron- a-resistant polyimide films （100HN and 100CR） before and after corona-aged 8 hours under electric field of 10kV/mm and 20kV/mm are measured respectively. The results show that the conduction current of corona-resistant polyimide film（100CR） is larger by about one order of magnitude than that of original polyimide film（100HN）, The electrical degradation threshold is 40MV/m for 100CR and 35MV/m for 100HN, and decreases with the increasing of corona-aged field. These data and curves provide very important reference value to understand the electrical degradation mechanism of polymers and synthesis modification of insulation materials.
出处
《绝缘材料》
CAS
2006年第2期17-19,共3页
Insulating Materials
基金
国家自然科学基金资助项目(59977003)
关键词
空间电荷
电老化阈值
电导电流
space charge
electrical degradation threshold
electric conduction current
