摘要
利用光敏三极管代替硅光电池和光敏二极管来测试单缝和双缝衍射的光强分布.由于光敏三极管的光电流较大,测试光电流时,可用普通的电流表(微安表)进行测量,使实验变得简单可行.
This paper introduces a new method to measure the intensity distribution of single seam diffraction by replacing the silicon photocell and light activated diode with light activated triode. Since the current produced by light activated triode is larger, it is possible to use common microammeter to measure the photocurrent, making the experiment easier.
出处
《实验技术与管理》
CAS
2006年第4期25-27,共3页
Experimental Technology and Management
关键词
单缝衍射
光强分布
光敏三极管
测量
single seam diffraction
light intensity distribution
light activated triode
measuring