摘要
电子束流寿命是个很重要的指标,直接影响合肥光源的正常运行,为此研究了影响束流寿命的因素,测量了高频腔压、耦合度以及束团长度对电子束流寿命的影响,研究显示合肥储存环的电子束流真空寿命和托歇克寿命相当;并且利用束损系统测量了因托歇克寿命的变化而造成束流损失的相对变化;通过增加耦合度增加束流的垂直发射度,有效地提高了束流的寿命,保证了合肥光源的正常运行。
The lifetime of electron beam is an important parameter, which is directly relative to the operation of HIS. In this paper, the influence of the RF cavity voltage, the coupling factor, and the bunch length on the HLS electron lifetime is studied. It shows that the electron beam vacuum lifetime is comparable to the Touscheck lifetime in HLS. With the Beam Loss Monitor system, the relative change of the beam lifetime is measured, due to the change of the Touscheck lifetime. To increase the coupling factor, the vertical emmitance of beam is increased, and the beam lifetime is improved effectively. The operation of HLS is ensured.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2006年第3期455-458,共4页
High Power Laser and Particle Beams
基金
中科院创新项目资助课题
关键词
真空寿命
托歇克寿命
腔压
耦合度
束流损失
Vacuum lifetime
Touseheck lifetime
Cavity voltage
Coupling factor
Beam loss
