基于CCD的XLPE杂质检测的研究

The Study of XLPE Impurity Testing Based on CCD

为提高现阶段XLPE电缆料杂质检测的精确度与速度,运用TCD132D芯片,建立了杂质检测系统,给出了硬件驱动电路.本系统采用虚拟示波器DSO2902对系统采集的数据进行分析和处理,从而有效识别杂质颗粒的存在与否.结果表明,该系统能够准确测出XLPE电缆料的杂质颗粒的横向与纵向尺寸,并能够确定该杂质颗粒所处的准确位置与杂质颗粒的个数等特性,其分辨力可达到20μm,误差小于10%,杂质的检出率达100%.

In order to improve the present accuracy and speed of XLPE cable materials impurity testing, we set up the impurity testing system using the TCD132D chip and design the hardware driving circuits, at last analyze and process the acquisition data using the virtual oscilloscope DSO2902. The method can discriminate whether the impurity particles exist or not effectively. The result shows that this system can measure the transverse and longitudinal size of impurity particles of XLPE cable materials correctly, and it also can find out the accurate location and numbers of impurity particles. The resolving power of this method can reach 20μm and the error is less than 10%. The possibility that the impurity particles can be checked out is up to 100%.