摘要
The spectral, angular and polarization characteristics of thermal radiation from plane-parallel Si films are studied experimentally. Pronounced spectral and angular peaks demonstrate the presence of thermal radiation coherence. Two kinds of multilayer films are designed to obtain favourable radiant properties. Tile ZrO2-Ge-ZnS film has a broad anti-reflection band in the wavelength range from 3.5μm to 8 μm. The spectral and angular emissivities of the MgF2-ZnS-Ge-Al film are tremendously enhanced compared with those of an uncoated aluminium film. This can be helpful to the design of elements that generate controlled thermal radiation.
The spectral, angular and polarization characteristics of thermal radiation from plane-parallel Si films are studied experimentally. Pronounced spectral and angular peaks demonstrate the presence of thermal radiation coherence. Two kinds of multilayer films are designed to obtain favourable radiant properties. Tile ZrO2-Ge-ZnS film has a broad anti-reflection band in the wavelength range from 3.5μm to 8 μm. The spectral and angular emissivities of the MgF2-ZnS-Ge-Al film are tremendously enhanced compared with those of an uncoated aluminium film. This can be helpful to the design of elements that generate controlled thermal radiation.
基金
Supported by the National Natural Science Foundation of China under Grant No 50376025.
