类铜金离子的双电子复合速率系数

Dielectronic Recombination Coefficients of Cu-Like of Au^(50+) Ion

在自旋轨道劈裂阵模型下,通过类锌组态,在理论上计算出了类铜Au50+的双电子复合速率系数,得出其在电子温度0.2~5.0 keV范围内的变化规律,分析了不同离化度离子的能级特征和影响双电子复合速率系数的主要因素,它们是相应的中间自电离态旁观电子的主量子数、自电离系数和电离能,为实现等离子体电子温度的诊断提供了重要的参数.

The calculations of the rate coefficients for dielectronic recombination （DR） along the CuI isoelectronic sequence in the ground state Au^50＋ are performed using the model of spin-orbit-split arrays （SOSA）. The trend of the DR rate coefficients is founded with the changing of the electronic temperature in the range of 0.02～5 keV. The main factors which put effects on the DR coefficients are the principal quantum numbers of the relative spectator electrons, the relative auto-ionization coefficients and auto-ionized energy. All the mentioned above will provide some important parameters for diagnosing the palasmas.