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Effects of donor density and temperature on electron systems in AlGaN/AlN/GaN and AlGaN/GaN structures 被引量:1

Effects of donor density and temperature on electron systems in AlGaN/AlN/GaN and AlGaN/GaN structures
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摘要 It was reported by Shen et al that the two-dimensional electron gas (2DEG) in an AlGaN/AlN/GaN structure showed high density and improved mobility compared with an AlGaN/GaN structure, but the potential of the AlGaN/AlN/GaN structure needs further exploration. By the self-consistent solving of one-dimensional Schroedinger- Poisson equations, theoretical investigation is carried out about the effects of donor density (0-1×10^19 cm^-3) and temperature (50-500 K) on the electron systems in the AlGaN/AlN/GaN and AlGaN/GaN structures. It is found that in the former structure, since the effective △Ec is larger, the efficiency with which the 2DEG absorbs the electrons originating from donor ionization is higher, the resistance to parallel conduction is stronger, and the deterioration of 2DEG mobility is slower as the donor density rises. When temperature rises, the three-dimensional properties of the whole electron system become prominent for both of the structures, but the stability of 2DEG is higher in the former structure, which is also ascribed to the larger effective △Ec. The Capacitance-Voltage (C - V) carrier density profiles at different temperatures are measured for two Schottky diodes on the considered heterostructure samples separately, showing obviously different 2DEG densities. And the temperature-dependent tendency of the experimental curves agrees well with our calculations. It was reported by Shen et al that the two-dimensional electron gas (2DEG) in an AlGaN/AlN/GaN structure showed high density and improved mobility compared with an AlGaN/GaN structure, but the potential of the AlGaN/AlN/GaN structure needs further exploration. By the self-consistent solving of one-dimensional Schroedinger- Poisson equations, theoretical investigation is carried out about the effects of donor density (0-1×10^19 cm^-3) and temperature (50-500 K) on the electron systems in the AlGaN/AlN/GaN and AlGaN/GaN structures. It is found that in the former structure, since the effective △Ec is larger, the efficiency with which the 2DEG absorbs the electrons originating from donor ionization is higher, the resistance to parallel conduction is stronger, and the deterioration of 2DEG mobility is slower as the donor density rises. When temperature rises, the three-dimensional properties of the whole electron system become prominent for both of the structures, but the stability of 2DEG is higher in the former structure, which is also ascribed to the larger effective △Ec. The Capacitance-Voltage (C - V) carrier density profiles at different temperatures are measured for two Schottky diodes on the considered heterostructure samples separately, showing obviously different 2DEG densities. And the temperature-dependent tendency of the experimental curves agrees well with our calculations.
机构地区 Key Lab of Minis
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第5期1060-1066,共7页 中国物理B(英文版)
关键词 ALGAN/ALN/GAN ALGAN/GAN two-dimensional electron gas C - V carrier density profile AlGaN/AlN/GaN, AlGaN/GaN, two-dimensional electron gas, C - V carrier density profile
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  • 1Shen L, Heikman S, Moran B, Coffie R, Zhang N Q,Buttari D, Smorchkova I P, Keller S, DenBaars S P and Mishra U K 2001 IEEE Electron Dev. Lett. 22 457.
  • 2Smorchkow I P, Chen L, Mates T, Shen L, Heikman S,Moran B, Keller S, DenBaars S P, Speck J S and MishraU K 2001 J. Appl. Phys. 90 196.
  • 3Fiorentini V, Bernardini F and Ambacher O 2002 Appl.Phys. Lett. 80 1204.
  • 4Vurgaftman I, Meyer J R and Ram-Mohan L R 2001 J.Appl, Phys. 89 5815.
  • 5Tan I H, Snider G L, Chang L D and Hu E L 1990 J.Appl. Phys. 68 4071.
  • 6Ambacher O, Smart J, Shealy J R, Weimann N G, ChuK, Murphy M, Schaff W J, Eastman L F, Dimitrov R,Wittmer L, Stutzmann M, Rieger W and Hilsenbeck J 1999 J. Appl. Phys. 85 3222.
  • 7Zhang J F, Zhang J C and Hao Y 2004 Chin. Phys. 13 1334.
  • 8Dziuba Z, Antoszewski J, Dell J M, Faraone L, Kozodoy P, Keller S, Keller B, DenBaars S P and Mishra U K 1997 J. Appl. Phys. 82 2996.
  • 9Zhong Y G, Shen B, Liu J, Yu H Q, Zhou H M, Qian Y,Zhang R, Shi Y and Zheng Y D 2001 Chin. J. Semiconductors 22 1420.
  • 10Arulkumaran S, Egawa T, Ishikawa H and Jimbo T 2002 Appl. Phys. Lett. 80 2186.

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