3Vrublevsky I,Parkoun V,Schreckenbach J.Analysis of porous oxide film growth on aluminum in phosphoric acid using re-anodizing technique[J].Applied Surface Science,2005,242(3-4):333-338.
8Zekovic Lj D,Urosevic V V,Jovanic B R.Determination of anodic oxide film thickness by a luminescence method[J].Applicaitons of Surface Science,1982,11-12:90-99.
9Pastore G F.Transmission interference spectrometric determination of the thickness and refractive index of barrier films formed anodically on aluminum[J].Thin Solid Film,1985,123(1):9-17.
