摘要
针对超大规模集成电路(VLSIC)的可靠性测试问题进行了理论分析,叙述了VLSIC可靠性测试技术及特点,并对VLSIC可靠性测试的设计方法与改善进行了归纳总结。
This paper analyzes the problems on the dependability testing of VLSIC ( Very Large Scale Integrated Circuit), and sums up the designing methods and the techniques of improving it. Based on this, it has important effects on VLSIC dependability testing improvement.
出处
《常州工学院学报》
2006年第2期16-17,26,共3页
Journal of Changzhou Institute of Technology