摘要
电镀参数测试仪测定电极双电层微分电容——电位曲线的电路是根据方波电位法的基本原理设计的。本文详细介绍了该仪器测定微分电容曲线的原理,讨论了某些典型的测试结果。
The electronic circuit of multi-purpose instrument for electroplater was designed for measuring the electrical double layer at the electrode, by means of the essential principle of rectangular potential. in this paper, the principle is described for determination of the differential capacity curve with it and some results of determination are discussed in detail.
出处
《材料保护》
CAS
CSCD
北大核心
1990年第9期24-26,共3页
Materials Protection
