KTiOPO_4波导的扩散性质及波导测量的研究

Research on Diffusion Property and Measurement of KTiOPO_4 Waveguides

采用不同来源的ＫＴＰ样品，利用离子交换法制备ＫＴＰ平面波导。借助于ｍ线技术测量了有效折射率，并利用逆ＷＫＢ法计算了波导的折射率分布、扩散深度和扩散系数，发现其扩散性质差异。产生原因可能与其双晶结构有关。本文还讨论了精确测量单轴或双轴晶衬底上波导的方法，提出了一个测量判据。

By means of ion-exchange, KTP waveguides have been fabricated on the KTP substates supplied by two different institutions. Effective refractive indices were measured by m-line technique.The refractive indices distribution, diffusive depth and diffusivity coefficients have been calculated using inverse WKB method. The difference of diffusion property was found between different samples. The cause may be related to the twin structure of KTP crystal. Measurement method for measuring waveguides on single or hi-hoal substates was discussed and a measurement criterion was proposed in this paper.