扫描电镜下材料的显微组织

The Microstructure of Material under Scanning Electro-Microscopy

扫描电镜(SEM)金相分析法具有光学金相法所难以比拟的优点;在SEM下,可以方便地从40～20000倍范围自由调节放大倍率,观察到在普通光学金相显微镜下所不可能看到的材料的立体图像。恒电位深腐蚀法是目前已知的制备扫描电镜用试样的最有效的方法。推广应用这种方法,可以更有效地分析金属材料的微观组织,扩大扫描电镜在微观分析中的应用范围。

The metallograph analysis method with scanning eletro-microscopy has been available obviously than with light microscopy. Under SEM we could conveniently unreservedly exchange magnifying power and observe the three-dimentional stereopictures of material microstructure which could't been observed under light microscope. The stationary potential deep-etching method is most available than other method to prepare for metallograph analyses on SEM. If popularized this method that would be effective to analyze the microstructure of metals and to increase applicable range of SEM in metallograph analysis.