基于电路板结构信息的近似近邻排序网络集生成算法

Approximate Adjacency Order of Nets Generation Algorithm Based on Structure Information of PCBs

结构测试算法是一类采用有限制故障模型获得紧凑性和完备性指标更为优化的边界扫描测试算法,现有的对该类算法的研究大多是在假定已具备近邻排序网络集的基础上进行的理论研究。本文提出了一种利用被测电路板的结构信息和最短路径算法获得准确的有限制短路故障模型,并基于此模型生成近似近邻网络排序集的算法。该算法获取电路板结构信息的方法简便科学,其数据计算在现有条件下易于实现,并且关键步骤可以编程完成,为结构测试算法从理论探讨进展到工程应用提供了必要条件。

Structural test algorithm is one of the boundary-scan test algorithms, which adopts limited shorting fault model to get further optimizing the compactness and completeness index. The existed studies on this algorithm are almost based on the assumption that adjacency order of nets were provided. This paper presented a practical algorithm that generates approximate adjacency order of the nets, based on limited shorting fault model acquired in the usage of the structure information of PCBs and Dijkstra algorithm. This algorithm can simply and scientifically get the structure information of PCBs, easily calculate data on existing condition, and programmably accomplish the crucial processes, which can provide a prerequisite to studying structural test algorithm from theory discussion to engineer application.