航空电子设备故障诊断技术研究综述

Summarization on techniques of fault diagnosis on avionic equipment

随着电子技术的发展,电子设备组成的复杂化和智能化不断提高,IC芯片制造工艺的不断提高使得VLSI电路的集成密度增加,亦加大了电路故障测试的复杂性和困难度。本文综述了电子电路的通用测试方法和技术,并分析了局限性。详细叙述了刚刚发展起来的基于知识的故障诊断方法,它的应用使对于一个较复杂的电子设备进行准确故障诊断成为可能,并对其发展进行了探讨和展望。

With the development of electronic technology, the electronic equipment become more and more complicated and intelligentized. And the high production level of IC chip increased the integration density of VLSI electric circuits, thus electric circuit fault diagnosis becomes more and more complex and difficult. The authors summarize the general methods and technologies and their limits for electronic circuit inspection. A newly developed fault diagnosis method based on knowledge is described in detail, whose application makes it possible for making an accurate fault diagnosis on the complicate electronic equipment.