摘要
基于微处理器指令译码功能故障模型，给出了各类指令所需的测试状态集应该具有的性质及其构造方法。
Based on the functional fault model of instruction decoding in microprocessors,this paper Slyes the properties of the tasting state set should have for any type of instructions and presents the method to construct such testing state sets.
出处
《重庆大学学报（自然科学版）》
CAS
CSCD
1996年第2期56-60,共5页
Journal of Chongqing University
关键词
功能测试
测试状态集
测试矩阵
微处理器
s:functional testing
testing state sets
testing matrix
conditional field pre-set
