摘要
低温ECL电路直流特性测试与分析高梅芳,沈克强,魏同立,李垚(东南大学微电子中心,南京210018)本文通过对低温ECL电路和常温ECL电路的比较和测试分析得知,晶体管饱和电流随温度下降而急剧下降,这是影响电路工作性能的主要因素.并指出,这种影响可通...
he DC operation situation of transistor at low tsmperature was measured and analyzed firstly. On these bases,the DC chsracteristics of ECL circuit at low temperature are also measured and analyzed. The advantages of low temperature circuit are pointed out. This peper also indicates that the drop of saturated current of BJTS with temperature decreasing has affected the ECL circuit operation badly.
出处
《东南大学学报(自然科学版)》
EI
CAS
CSCD
1996年第1期134-138,共5页
Journal of Southeast University:Natural Science Edition