嵌入式只读存储器的内建自测试设计

Built-in Self-test for Embedded Read-only Memory

随着存储器件日益向着高速、高集成方向发展,依靠外部设备对嵌入式存储器的测试变得越来越困难,内建自测试是解决这个问题的有效方法;文中详细分析了存储器的故障表现和诊断算法,给出了嵌入式只读存储器的内建自测试的一种设计实现,同时研究了将边界扫描技术与只读存储器的内建自测试相结合、形成层次化系统芯片SoC的设计策略。

With the memory＇s growth towards high-speed and high-integration, to test embedded memory with external equipment is becoming more and more difficult, BIST （built-in self-test） is very effective in solving this problem. Fault displays and fault diagnosis algorithms of memory is analyzed in detail, a design implementation of embedded ROM BIST is given. Finally, design strategy of combining Boundary Scan Solution with ROM BIST to form hierarchical SoC is discussed.