X射线Φ扫描峰宽判据

A Criterion for the Width of X -ray Diffraction φ Scan Peaks

本文从行射几何出发,提出了判断X射线Φ扫描峰宽的判据,并用实验数据对其进行了验证。实验结果还表明:Soller狭缝角孔径过大是产生X射线Φ扫描仪器宽度的主要原因。

In this paper, a criterion for determination of the width of x - ray diffraction O scan peaks is established by analyzing the diffraction geometry. To prove the criterion some experiments were carried out , and the experimental results show that the criterion is correct. The experimental results also show that the angular aperture of seller slits has much contribution to the width of X-ray diffraction φ scan peaks.