摘要
分析了隧道再生双有源区A lG aInP发光二极管的工作原理,测试了不同注入电流下管芯的轴向光强,得到了轴向光强随注入电流的变化关系。20 mA注入电流条件下,发射峰值波长为620 nm的隧道再生双有源区A lG aInP发光二极管,透明封装成视角15°后平均轴向光强达到5.5 cd。对透明封装成15°隧道再生双有源区发光二极管进行了寿命实验,在温度为25°C、30 mA直流电流条件下,隧道再生双有源区A lG aInP发光二极管的寿命超过了1.2×105h。
The operating principal of tunneling-regenerated-double-active-region (TRDAR) AlGaInP light-emitting diodes is analyzed on-axis luminous intensity is tested under different injected current and the relationship between on-axis luminous intensity and injected current is offeted in this paper. The emitting peak wavelength of TRDAR AIGalnP light-emitting diodes is 620 nm at 20 mA. The average on-axis luminous intensity of TRDAR AlGaInP light-emitting diodes lamps with 15° viewing angle is 5.5 cd. Its life test is carried, and the lifetime of TRDAR AlGaInP light-emitting diodes has exceeded 1.2 × 10^5 hours under conditions of 30 mA direct current and 25℃ ambient temperature.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
2006年第2期205-208,共4页
Research & Progress of SSE
基金
973计划(批准号:G20000683-02)
市教委项目(KP0204200201)
国家基金(60077004)的支持
关键词
铝镓铟磷
发光二极管
隧道结
可靠性
AlGalnP
light-emitting diodes
tunnel junction
reliability