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高可靠高亮度AlGaInP发光二极管

Highly Reliability and Brightness AlGaInP Light-emitting Diodes
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摘要 分析了隧道再生双有源区A lG aInP发光二极管的工作原理,测试了不同注入电流下管芯的轴向光强,得到了轴向光强随注入电流的变化关系。20 mA注入电流条件下,发射峰值波长为620 nm的隧道再生双有源区A lG aInP发光二极管,透明封装成视角15°后平均轴向光强达到5.5 cd。对透明封装成15°隧道再生双有源区发光二极管进行了寿命实验,在温度为25°C、30 mA直流电流条件下,隧道再生双有源区A lG aInP发光二极管的寿命超过了1.2×105h。 The operating principal of tunneling-regenerated-double-active-region (TRDAR) AlGaInP light-emitting diodes is analyzed on-axis luminous intensity is tested under different injected current and the relationship between on-axis luminous intensity and injected current is offeted in this paper. The emitting peak wavelength of TRDAR AIGalnP light-emitting diodes is 620 nm at 20 mA. The average on-axis luminous intensity of TRDAR AlGaInP light-emitting diodes lamps with 15° viewing angle is 5.5 cd. Its life test is carried, and the lifetime of TRDAR AlGaInP light-emitting diodes has exceeded 1.2 × 10^5 hours under conditions of 30 mA direct current and 25℃ ambient temperature.
出处 《固体电子学研究与进展》 CAS CSCD 北大核心 2006年第2期205-208,共4页 Research & Progress of SSE
基金 973计划(批准号:G20000683-02) 市教委项目(KP0204200201) 国家基金(60077004)的支持
关键词 铝镓铟磷 发光二极管 隧道结 可靠性 AlGalnP light-emitting diodes tunnel junction reliability
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参考文献5

  • 1Gessmann Th,Schubert E F.High-efficiency AlGaInP light-emitting diodes for solid-state lighting application[J].Appl Phys,2004;95(5):2 203~2 216
  • 2Kish F A,Vanderwater D A,Defevere D C,et al.Highly reliable and efficient semiconductor waferbonded AlGaInP/GaP light-emitting diodes[J].Elec Lett,1996 ; 32 (2):132-134
  • 3Guo X,Wang G H,Zhu W,et al.The study of Novel high brightness 620 nm AlGaInP light emitting diodes[A].Proceeding of the Sixth Internation Conference on Solid-state and Integrated-circuit Technology[C].Shanghai,China,2001:1 252-1 254
  • 4Sheu J K,Chi G C,Jou M J.Enhanced output power in an InGaN-GaN multiquantum-well light-emitting diode with an InGaN current-spreading layer[J].IEEE Photonics Technology Letters,2001:13 (11):1 164-1 166
  • 5Lin J F,Wu M C,Lou M J,et al.Highly reliable operation of indium tin oxide AlGaInP orange light-emitting diodes[J].Electron Lett,1994; 30 (21):1 793-1 794

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