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X射线粉末衍射数据的校正 被引量：5

Calibration of X-ray powder diffraction data
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摘要 扼要介绍了X射线粉末衍射数据(峰位峰强和峰形)的校正方法和使用的标样。 The calibration method of X-ray powder diffraction data including the peak position, peak intensity and profile were interpreted and the standard reference materials were also introduced.
作者 马礼敦
机构地区 复旦大学分析测试中心同步辐射研究中心
出处 《上海计量测试》 2006年第3期10-16,共7页 Shanghai Measurement and Testing
关键词 X射线粉末衍射 衍射数据 数据校正 X-ray powder diffraction Diffraction data Data calibration
分类号 TB44 [一般工业技术]
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参考文献13

  • 1[1]Dragoo A L.Standard reference materials for X-ray diffraction.Part 1.Overview of current and future standard reference methods.Powder Diffraction.1986,1:294～298.
  • 2[2]Cline J.NIST Standard Reference Materials for Characterization of Instrument Performance.in Chung F,Smith D,ed.Industrial Applications of X-ray Diffraction.New York:Marcel Dekker,2000.903～917.
  • 3[3]Wong-ng W,Hubbard C R.Standard reference materials for X-ray diffraction.Part 2.Calibration using d-spacing standards.Powder Diffraction.1987,2(4):242～248.
  • 4[4]Fawcett T G,Crowder C E,Brownell S J,et al.Establishing an instrumental peak profile calibration standard for powder diffraction analyses:International round robin conducted by the JCPDS-ICDD and the U.S.National Bureau of Standards.Powder Diffraction.1988,3(4):209～218.
  • 5[5]National Institute of Standard and Technology.Certificate standard reference material 640c silicon powder,line position and line shape standard for powder diffraction.Gaitherburg,USA:2000.
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  • 7[7]Huang T C,Toraya H,Blanton T N,Wu Y.X-ray powder diffraction analysis of silver behenate,A possible low-angle diffraction standard.J Appl Cryst.1993,26:180～184; Powder Diffraction.1995,10:91～95.
  • 8[8]Wu W-G(吴万国),Ruan Y-Z(阮玉忠).An external standard method for angular calibration of powder diffractometers.Powder Diffraction.2000,15:173～174
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  • 10[11]Bertin E P.Principles and Practice of X-ray Spectrometric Analysis.2nd edition.New York:Plenum Press,1975,Chap 6,219～284.

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上海计量测试
2006年 第3期

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