亚纳克级全反射X射线荧光分析装置研制

DEVELOPMENT OF A TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS EQUIPMENT WITH DETECTION LIMITS OF SUBNANOGRAM LEVEL

文章概述了自行研制的亚纳克级全反射Ｘ射线荧光分析（ＴＸＲＦ）装置的结构和性能。该ＴＸＲＦ分析装置系利用本实验室已有的岛津ＸＤ－１型衍射仪的Ｘ光发生器及Ｃｕ靶衍射管作光源，从国外引进一套两次全反射光路组件，配以Ｓｉ（Ｌｉ）探测器－多道微机分析系统组装而成。使用与之配套而开发的ＳＰＡＮ／ＸＲＦＶ４．０Ｘ射线谱处理软件。实验测试结果表明，对原子序数为１６—２８诸元素，探测下限（ＭＤＬ）达０．１ｎｇ量级。

This paper describes the structure and performance of a self-made total reflection X-ray fluorescence analysis equipment with detection limits of subnanogram level.This equipment consists of three main parts:a generator of Shimadzu XD-1 X-ray diffractometer with a Cu anode X-ray tube already present in the lab, a flexible TXRF attachment imported from Austria,and a Si(Li)detector multichannel analysis system supplied by the department of applied nuclear technique, Advanced software SPAN/XRF V 4.0 for processing X-ray spec tra developed simultaneously is applied. The test results indicate that the detection limits for elements of atomic number 16 28 at subnanogram level are reached.