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局域寿命控制NPT-IGBT瞬态模型 被引量:3

A Dynamic-State Model of an NPT-IGBT with Localized Lifetime Control
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摘要 提出了局域寿命控制下NPT IGBT的瞬态模型,并与数值分析结果进行了对比,验证了模型的正确性.该模型采用了准静态近似,将关断过程分为快速下降阶段和缓慢下降阶段分别加以求解而得到.基于该模型,详细讨论了局域低寿命区参数对关断时间的影响.该模型将有助于理解局域寿命控制NPT IGBT的关断过程物理图像,同时也可以用于指导该类器件的设计和优化.文中所采用的分析方法具有一定的普适性,其他类似结构和器件亦可采用此方法进行分析. A novel dynamic-state model of an NPT-IGBT with localized lifetime control is proposed and is verified by the 2D simulator MEDICI. In this model, the quasi-static-state approximation is used, and the turn-off stage is divided into two stages, including a fast turn-off and a slow turn-off, to characterize the turn-off. With this model,the dynamic characteristics of a localized lifetime control NPT-IGBT, as influenced by the parameters of the localized low-lifetime region, are discussed in detail. This model is helpful for understanding the physical mechanisms in an NPT-IGBT with localized lifetime control during the turn-off period and can be used to the direct design and optimization of an NPT-IGBT. The modeling and analysis methods used here are universal and also can be used in other conductivity modulation power devices.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第6期1078-1083,共6页 半导体学报(英文版)
基金 国家军事电子预研(批准号:41308020405) 武器装备预研基金(批准号:51408030404DZ0215)资助项目~~
关键词 局域寿命控制 NPT-IGBT 关断时间 电导调制 localized lifetime control NPT-IGBT turn-off time conductivity modulation
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参考文献9

  • 1Vobecky J,Hazdra P.Future trends in local lifetime control.Proc ISPSD,1996:161
  • 2Konishi Y,Onishi Y,Momota S.Optimized local lifetime control for the superior IGBT's.Proc ISPSD,1996:335
  • 3Saggio M,Raineri V,Letor R,et al.Innovative localized lifetime control in high-speed IGBT's.IEEE Electron Device Lett,1997,18(7):333
  • 4方健,唐新伟,李肇基,张波.低能量He离子注入局域寿命控制LIGBT的实验研究(英文)[J].Journal of Semiconductors,2004,25(9):1048-1054. 被引量:3
  • 5Baliag B J.Analysis of insulated gate transistor turn-off characteristics.IEEE Electron Device Lett,1984,6(2):74
  • 6Hefner A R.Analytical modeling of device-circuit interaction for the power insulated gate bipolar transistor(IGBT).IEEE Trans Industry Application,1990,26(6):995
  • 7Fossum J G,Mcdonald R L.Network representations of LIGBT structures for CAD of power integrated circuits.IEEE Trans Electron Devices,1988,35(4):507
  • 8Li Zhaoji,Zhang Ming,Fang Jian.Analytical turn-off current model for type of conductivity modulation power MOSFETs with extracted excess carrier.Solid-State Electron,2000,44(1):1
  • 9Jorda X,Vobecky J,Godignon P,et al.Electrical parameter variation of IGBT by backside proton irradiation.ISPS'03,2003:289

二级参考文献11

  • 1[1]Baliga B J.Comparison of gold,platinum,and electronirradiation for controlling lifetime in power rectifiers.IEEE Trans Electron Devices,1977,24(6):685
  • 2[2]Temple A K.Optimizing carrier lifetime profile for improved trade-off between turn-off time and forward drop.IEEE Trans Electron Devices,1983,30(7):782
  • 3[3]Antonio M C,Robert P L.Localized lifetime control in insulated-gate transistors by proton implantation.IEEE Trans Electron Devices,1992,33(11):1667
  • 4[4]Seager C H,Myers S M.Electrical properties of He-implantation produced nanocavities in silicon.Phys Rev B,1994,50(4):2458
  • 5[5]Raineri V,Fallica G.Gettering of metals by voids in silicon.J Appl Phys,1995,79(6):3727
  • 6[6]Raineri V,Saggio M.Voids in silicon power devices.Solid-State Electron,1998,42(12):2295
  • 7[7]Saggio M,Raineri V.Innovative localized lifetime control in high speed IGBT's.IEEE Trans Electron Devices,1997,18(7):333
  • 8[8]Raineri V,Fallica G.Lifetime control in silicon devices by voids induced by He ion implantation.J Appl Phys,1996,79(12):9012
  • 9[9]Li Zhaoji,Zhang Ming,Yang Jian,et al,Analytical turn-off current model for type of conductivity modulation power MOSFETs with extracted excess carrier.Solid-State Electron,2000,44(1):1
  • 10[10]Li Zhaoji,Du Juan.Turnoff transient characteristics of complementary insulated-gate bipolar transistor.IEEE Trans Electron Devices,1994,41(12):2468

共引文献2

同被引文献45

  • 1孟进,马伟明,张磊,赵治华.基于IGBT开关暂态过程建模的功率变流器电磁干扰频谱估计[J].中国电机工程学报,2005,25(20):16-20. 被引量:51
  • 2蔡慧,赵荣祥,陈辉明,汪世平.倍频式IGBT高频感应加热电源的研究[J].中国电机工程学报,2006,26(2):154-158. 被引量:30
  • 3梅杨,孙凯,黄立培.基于逆阻式IGBT的三相/单相矩阵式变换器[J].电工技术学报,2007,22(3):91-95. 被引量:15
  • 4Tang Yong, Chen Ming, Wang Bo. New methods for extracting field-stop IGBT model parameters by electrical measurements[C]//IEEE International Symposium on IndustrialElectronics. Korea: IEEE, 2009: 1546-1551.
  • 5Tang Yong, Chen Ming, Wang Bo. An improved method for IGBT base excess carrier lifetime extraction[C]// Applied Superconductivity and Electromagnetic Devices. Chendu, China: IEEE, 2009: 206-210.
  • 6Majumdar G, Minato T. Recent and future IGBT evolution[C]//Power Conversion Conference. Nagoya, Japan: IEEE, 2007: 355-359.
  • 7Otsuki M, Onozawa Y, FS-IGBT module with capability[C]//Proceedings Symposium on Power ICs. Kitakyushu, Japan: Yoshiwatari S, et al. 1200V enhanced dynamic clamping of 2004 International Semiconductor Devices and IEEE, 2004: 339-342.
  • 8Ruething H, Umbach F, Hellmund O, et al. 600V-IGBT3.- trench field Stop technology in 70pm ultra thin wafer technology[C]// International Symposium on Power Semiconductor Devices and ICs. Cambridge, UK: IEEE, 2003: 14-17.
  • 9Pfenlehner M, Laska T, Mallwitz R. 1700V IGBT3: field stop technology with optimized trench structure-trend setting for the high power applications in industry and traction[C]//International Symposium on Power Semiconductor Devices and ICs. Mexico: IEEE, 2002: 105-108.
  • 10Bryant A T, Lu Liqing, Santi E, et al. Modeling of IGBT resistive and inductive turn-On behavior[J]. IEEE Trans. on lndustryApplication, 2008, 44(3): 904-914.

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