摘要
铁基合金锡、锌镀层的厚度通常采用湿法化学法分析,本文根据在临界厚度以内,X射线荧光强度与样品厚度有关的原理,用波长色散X射线荧光光谱仪测定镀锡板(俗称马口铁)、镀锌板中的SnKα_1、ZnKα_(1.2)、FeKα_(1.2)等特征谱线的强度,然后用线性回归和非线性拟合等方法获得谱线强度和镀层厚度之间的数学关系。本法测量锡、锌镀层厚度准确、快速、简便,所得结果可与湿法化学分析结果相比。
The thickness of tin, zuic coatings on steel is always measured by wet chemical analysis method. In this paper, according to theory that within the critical thickness, the intensity of Xray fluorescence is relative to the thickness of the sample, the instensity of characteristic X-ray SnKα_1, Znkα_(1,2) , FeKα_(1,2) of the Tin-plate and galvanized sheet is measured by sequential XRF spectrometer, liner regression and nonlinear fit is used to get the mathematic relation of the intensity and coating thickness. This method is accurate, rapid and simple and the results are comparable to the those obtained by wet chemical method.
出处
《光谱实验室》
CAS
CSCD
1996年第5期11-16,共6页
Chinese Journal of Spectroscopy Laboratory