光电二极管弱光光敏特性测试仪的开发

Development of instrument to measure properties of weak light of photodiode

为了进行光电二极管的弱光光敏特性的测量和标定,改进现有测试仪只能适应日光环境且电路板体积大、线路连接复杂的缺欠,开发了一种光电二级管弱光光敏特性测量仪,并提出进一步改进的方法．

To meet the need of using photoelectric instrument to measure the photosensitive properties of the weak light of photodiode, because the current equipment is used in the daylight and the circuit is big and complicated, the instrument to measure properties of weak light of photodiode is developed, and the improved method is given.