一个与马铃薯青枯病抗性连锁的SRAP标记筛选

Identification of a SRAP Marker Linked to Bacterial Wilt Resistance in Diploid Potato

以两个马铃薯二倍体分离群体ED和CE共105个基因型为材料,利用群分法(BulkedSegregantAnalysis,BSA)筛选与马铃薯青枯病抗性基因连锁的分子标记。在8个正向引物和11个反向引物组成的88对SRAP引物组合中,筛选获得了一个与马铃薯青枯病抗性紧密连锁的SRAP标记M32,遗传连锁分析表明,该标记在ED群体和CE群体中与抗性位点之间的遗传距离分别为10.2cM和17.3cM。

In this paper, bulked segregant analysis was used to identify SRAP markers linked to bacterial wih resistance in the two segregating populations （CE and ED） of diploid potato. A SRAP marker M32 linked to resistant gene RBW, was screened from 88 pairs of combination with 8 forward primers and 11 reverse primers. The genetic distance between the M32 and site of bacterial wilt resistance was 10.2 cM and 17.3 cM in ED and CE population, respectively,