摘要
目的研究2种饰瓷材料与牙科氧化锆支架材料烧结界面的情况。方法对饰瓷材料进行X射线衍射分析,检测烧结后成分,采用粉浆涂塑法将2种饰瓷材料分别烧结于氧化锆支架材料上,并通过扫描电镜观察界面情况。结果两种饰瓷材料G-1、G-2烧结后均析出霞石、斜长石和硅灰石等晶体,与氧化锆烧结界面清晰光滑。结论G-1、G-2能够与氧化锆陶瓷支架材料匹配,可以作为饰瓷材料。
Objective To evaluate the interfaces between two kinds of veneer porcelains and dental Zirconia framework material. Methods X-ray diffraction analysis （XRD） was used to examine the components of two kinds of veneer porcelains after sintering. Veneer porcelains were sintered on the surface of pre-sintered Zirconia ceramic plate under respective procedure. Scanning electron microscope （SEM） was ap- plied to observe the interfaces between two kinds of veneer porcelains and dental Zirconia framework material. Results XRD patterns of veneer porcelains showed that some kinds of crystals such as Nephelina, Anorthoclase and Wollastonite were separated out after sintering. SEM result showed that the interfaces between 3YPSZ and two kinds of veneer porcelains were clear and smooth. Conclusion Further research could be carried out on G-1 and G-2 as veneer porcelains combined with 3YPSZ ceramic framework.
出处
《口腔医学》
CAS
2006年第3期161-163,共3页
Stomatology
基金
国家自然科学基金资助项目(30070820)
