利用能量过滤TEM获取外延量子点的成分信息(英文)

Extracting compositional information of epitaxial quantum dots using energy-filtered transmission electron microscopy

半导体量子点应用于许多关键的现代科学技术中。量子点的尺寸和成分对决定量子点光电性质十分重要。由于量子点的尺寸很小,表征量子点的成分及其分布是一项很有挑战性的任务。本文综述了能量过滤透射电子显微术如何应用于量子点成分的研究。

Semiconductor quantum dots have potential applications in many key areas of modem technology. The dimension and composition of quantum dots are very important in determining the opto-electronic properties of the quantum dots. However, the characterization of quantum dot composition profiles is a very challenging task because of small quantum dot sizes. In this papers, we review how energy-filtered transmission electron microscopy is applied to the investigation of quantum dot composition.