未来测试系统结构

Future Test System Architectures

在测试领域大量测试系统结构的存在使选择很易混淆,为此,总结了现存测试系统结构(GPIB、PC、VX I和PX I)的特点,并提出了一种新的基于LAN的测试系统结构。对各种测试系统结构的价格、通道数、尺寸、I/O速度和适应性等进行了比较,其目的是为未来的应用中提供最有效的测试系统。

Expanding number of test system architectural choices has caused confusion. The strengths and weaknesses of the existing test system architectures including rack and stack systems with GPIB instruments and modular systems like VXI and PXI are introduced. A new architecture of LAN-based test system is provided. The key factors such as cost, channel count, footprint, IO speed, ease-of-integration, and flexibility are reviewed. Its objective is to provide engineers insight into the most effective test systems for their future applications.